Advanced Production Testing of RF, SoC, and SiP Devices

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...

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Bibliographic Details
Main Author: Kelly, Joe, Ph. D
Corporate Author: Ebooks Corporation
Format: Electronic Book
Language:English
Published: Norwood : Artech House, 2006
Series:Artech House microwave library
Subjects:

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Stanford University

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Call Number: INTERNET RESOURCE