Advanced Production Testing of RF, SoC, and SiP Devices
Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that ar...
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Format: | Electronic Book |
Language: | English |
Published: |
Norwood :
Artech House,
2006
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Series: | Artech House microwave library
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Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Stanford University
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INTERNET RESOURCE |
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