Combined analysis /
Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models. Finally, the book introduces the combined analy...
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| Format: | Book |
| Language: | English |
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London, UK : Hoboken, NJ :
ISTE ; Wiley,
2010
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| Subjects: |
Internet
University of Chicago
| Call Number: |
QD75.3 .C45 2010 |
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Massachusetts Institute of Technology
| Call Number: |
QD75.3.C45 2010 |
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Duke University
| Call Number: |
QD75.3 .C45 2010 |
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Columbia University
| Call Number: |
QD75.3 .C45 2010 |
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Brown University
| Call Number: |
QD75.3 .C45 2010 |
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