Modern surface analysis : metallurgical applications of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) : Las Vegas, Nevada February 23-24, 1980 /

Modern surface analysis : metallurgical applications of Auger electron spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) : Las Vegas, Nevada February 23-24, 1980 /

Bibliographic Details
Corporate Authors: Metallurgical Society of AIME Continuing Education Committee, Metallurgical Society of AIME
Other Authors: Davis, L. E
Format: Book
Language:English
Published: Warrendale, Pa. : Metallurgical Society of AIME, c1979
Warrendale, Pa. : The Metallurgical Society of AIME, [1979], ©1979
Series:TMS-AIME short course
Subjects:
Electron spectroscopy
Metals > Surfaces > Testing
Surfaces (Technology) > Testing
Surfaces (Technology)
Conference papers and proceedings

Internet

Massachusetts Institute of Technology

Holdings details from Massachusetts Institute of Technology
Call Number: TA418.7.M62 1980

Duke University

Holdings details from Duke University
Call Number: 670.425 M689, 1979

Columbia University

Holdings details from Columbia University
Call Number: QC454.E4 M6

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