X-Ray Structure Analysis /

This book offers a compact overview on crystallography, symmetry, and applications of symmetry concepts. The author explains the theory behind scattering and diffraction of electromagnetic radiation. X-ray diffraction on single crystals as well as quantitative evaluation of powder patterns are discu...

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Bibliographic Details
Main Author: Siegrist, Theo (Author, http://id.loc.gov/vocabulary/relators/aut)
Corporate Author: De Gruyter
Format: Book
Language:English
Published: Berlin ; Boston : De Gruyter, [2021]
Series:De Gruyter Textbook
Subjects:

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