Synchrotron VUV and soft X-ray radiation effects on aluminized teflon FEP /
Corporate Author: | |
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Other Authors: | |
Format: | Government Document Book |
Language: | English |
Published: |
[Cleveland, Ohio] : Springfield, VA :
National Aeronautics and Space Administration, Lewis Research Center ; National Technical Information Service, distributor,
[1998]
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Series: | NASA technical memorandum
208828 |
Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Stanford University
Call Number: |
NAS 1.15:208828 |
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