Self-testing VLSI design /

Self-testing VLSI design /

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Bibliographic Details
Main Authors:	I͡Armolik, V. N (Vi͡acheslav Nikolaevich), I︠A︡rmolik, V. N (Vi︠a︡cheslav Nikolaevich)
Other Authors:	Kachan, I. V
Format:	Book
Language:	English
Published:	Amsterdam ; New York : Elsevier, 1993 Amsterdam ; New York : 1993
Subjects:	Integrated circuits > Very large scale integration > Design and construction Integrated circuits > Very large scale integration > Design Integrated circuits > Very large scale integration > Testing Integrated circuits > Very large scale integration

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Stanford University

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Call Number:	TK7874 .I16 1993

Massachusetts Institute of Technology

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Call Number:	TK7874.I16 1993

Johns Hopkins University

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Call Number:	TK 7874 .I161 1993

Cornell University

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Call Number:	TK7874 .I16x 1993

Columbia University

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Call Number:	TK7874 .I16 1993

University of Pennsylvania

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Call Number:	TK7874 .I16 1993