Model-based testing for embedded systems /

Model-based testing for embedded systems /

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Model-Based Testing for Embedded Systems

Bibliographic Details
Other Authors: Mosterman, Pieter J, Schieferdecker, Ina, Zander, Justyna
Format: Book
Language:English
Published: Boca Raton, FL : CRC Press, ©2012
Series:Computational analysis, synthesis, and design of dynamic models series
Subjects:
Embedded computer systems > Testing
COMPUTERS > Hardware > Mainframes & Minicomputers
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