Advanced production testing of RF, SoC, and SiP devices /

Advanced production testing of RF, SoC, and SiP devices /

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Bibliographic Details
Main Authors: Kelly, Joe, Kelly, Joe, Ph. D
Other Authors: Engelhardt, M (Michael)
Format: Book
Language:English
Published: Boston : Artech House, 2007
Boston, Mass. : c2007
Norwood, MA : [2007], ©2007
Series:Artech House microwave library
Subjects:
Systems on a chip > Testing
Systems on a chip
Testing

Internet

Stanford University

Holdings details from Stanford University
Call Number: TK7895 .E42 K45 2007

Massachusetts Institute of Technology

Holdings details from Massachusetts Institute of Technology
Call Number: TK7895.E42.K49 2007

Columbia University

Holdings details from Columbia University
Call Number: TK7895.E42 K45 2007g

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