Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits /

Proceedings of the 1999 7th International Symposium on the Physical & Failure Analysis of Integrated Circuits /

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Bibliographic Details
Corporate Authors:	International Symposium on the Physical & Failure Analysis of Integrated Circuits Singapore, IEEE Reliability/CPMT/ED Singapore Chapter, IEEE Singapore Section Reliability/CPMT/EDA Chapter, IEEE Singapore Section Reliability/CPMT/EDS Chapter
Other Authors:	Chim, Wai Kin, Radhakrishnan, M. K, Thong, John T. L, Thong, John
Format:	Conference Proceeding Book
Language:	English
Published:	Piscataway, New Jersey : IEEE, [1999], ©1999 Piscataway, New Jersey : c1999
Subjects:	Integrated circuits > Defects > Congresses Integrated circuits > Testing > Congresses Integrated circuits Integrated circuits > Defects Integrated circuits > Testing Conference papers and proceedings

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Massachusetts Institute of Technology

Holdings details from Massachusetts Institute of Technology
Call Number:	TK7874.I59249 1999

Johns Hopkins University

Holdings details from Johns Hopkins University
Call Number:	TK7874.I687 1999 QUARTO

Cornell University

Holdings details from Cornell University
Call Number:	TK7874 .I687x 1999

Columbia University

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Call Number:	TK7874 .I684 1999g