Encyclopedia of materials characterization : surfaces, interfaces, thin films /

Encyclopedia of Materials Characterization is a comprehensive volume on analytical techniques used in materials science for the characterization of surfaces, interfaces and thin films. This flagship volume in the Materials Characterization Series is a unique, stand-alone reference for materials scie...

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Bibliographic Details
Main Author:	Brundle, C. R
Other Authors:	Evans, Charles A, Wilson, Shaun
Format:	Book
Language:	English
Published:	Boston : Greenwich, CT : Butterworth-Heinemann ; Manning, 1992 Boston : Greenwich, CT : 1992
Series:	Materials characterization series Materials characterization series
Subjects:	Surfaces (Technology) > Testing Surfaces (Technology)

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Stanford University

Holdings details from Stanford University
Call Number:	TA418.7 .B73 1992

Massachusetts Institute of Technology

Holdings details from Massachusetts Institute of Technology
Call Number:	TA418.7.B73 1992

Johns Hopkins University

Holdings details from Johns Hopkins University
Call Number:	TA 418.7 .B731 1992

Dartmouth College

Holdings details from Dartmouth College
Call Number:	TA418.7 .B73 1992

University of Pennsylvania

Holdings details from University of Pennsylvania
Call Number:	TA418.7 .B73 1992