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  1. 1
    17th Annual Symposium on Photomask Technology and Management : : 17-19 September, 1997, Redwood City, California /
    Published 1998

    Conference Proceeding Book
  2. 2
    Metrology, inspection, and process control for microlithography XIII : 15-18 March, 1999, Santa Clara, California /
    Published 1999

    Book
  3. 3
    18th Annual Symposium on Photomask Technology and Management : : 16-18 September, 1998, Redwood City, California /
    Published 1998

    Conference Proceeding Book
  4. 4
    Photomask and next-generation lithography mask technology XI 14-16 April, 2004, Yokohama, Japan /
    Published 2004

    Conference Proceeding Book
  5. 5
    Optical microlithography XVII : 24-27 February 2004, Santa Clara, California, USA /
    Published 2004

    Book
  6. 6
    16th Annual Symposium on Photomask Technology and Management : proceedings : 18-20 September, 1996, Redwood City, California /
    Published 1996

    Conference Proceeding Book
  7. 7
    Optical microlithography XII : 17-19 March, 1999, Santa Clara, California /
    Published 1999

    Book
  8. 8
    Metrology, inspection, and process control for microlithography XVI : 26 4-7 March, 2002, Santa Clara, [California] USA /
    Published 2002

    Book
  9. 9
    In-line characterization, yield reliability, and failure analyses in microelectronic manufacturing : 19-21 May, 1999, Edinburgh, Scotland /
    Published 1999

    Book
  10. 10
    Annual Symposium on Photomask Technology /
    Published 1999

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Conference Proceeding
  11. 11
    Optical microlithography XVII : 24-27 February, 2004, Santa Clara, California, USA /
    Published 2004

    Book
  12. 12
    Metrology, inspection, and process control for microlithography XVIII : 23-26 February, 2004, Santa Clara, California, USA /
    Published 2004

    Book
  13. 13
    Photomask and next-generation lithography mask technology XI : 14-16 April, 2004, Yokohama, Japan /
    Published 2004

    Conference Proceeding Book
  14. 14
    20th European Conference on Mask Technology for Integrated Circuits and Microcomponents : 12-14 January 2004, Dresden, Germany /
    Published 2004

    Conference Proceeding Book
  15. 15
    24th Annual BACUS Symposium on Photomask Technology : 14-17 September 2004, Monterey, California, USA /
    Published 2004

    Conference Proceeding Book
  16. 16
    Optoelectronic integrated circuits VII 25-27 January 2005, San Jose, California, USA /
    Published 2005

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Electronic Book
  17. 17
    Advanced microlithography technologies 8-10 November 2004, Beijing, China /
    Published 2005

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Electronic Book
  18. 18
    Optical microlithography XVIII : 1-4 March, 2005, San Jose, California, USA /
    Published 2005

    Book
  19. 19
    Metrology, inspection, and process control for microlithography XIX 28 February-3 March, 2005, San Jose, California, USA /
    Published 2005

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Electronic Book
  20. 20
    Optoelectronic integration on silicon II 25-26 January 2005, San Jose, California, USA /
    Published 2005

    This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.
    Electronic Book
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