SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain /
Corporate Authors: | , , |
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Other Authors: | , |
Format: | Book |
Language: | English |
Published: |
Bellingham, Wash., USA :
SPIE,
c2000
Bellingham, Wash. : c2000 |
Series: | Proceedings EurOpt series
Europto series Proceedings of SPIE--the International Society for Optical Engineering ; v. 4173 |
Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Massachusetts Institute of Technology
Call Number: |
TK6592.S95.S275 2000 |
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Duke University
Call Number: |
ISIL:US-NCD |
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