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022 0 |a 1093-0167 
035 |a (NIC)notisANH9713 
035 |a (OCoLC)32735362 
035 |a 2697138 
040 |a CSt  |c CSt  |d NIC 
050 4 |a TK7874  |b .I243 
111 2 |a IEEE VLSI Test Symposium 
245 1 0 |a Proceedings ... IEEE VLSI Test Symposium /  |c sponsored by the IEEE Computer Society, Technical Committee on Test Technology [and] IEEE Philadelphia Section 
246 1 0 |a IEEE VLSI Test Symposium 
246 1 0 |a VLSI Test Symposium 
260 |a Los Alamitos, Calif. :  |b IEEE Computer Society Press,  |c c1994- 
300 |a v. :  |b ill. ;  |c 28 cm 
310 |a Annual 
362 0 |a 12th (1994)- 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing  |x Congresses 
650 7 |a Integrated circuits  |x Very large scale integration  |x Testing  |2 fast 
655 7 |a Conference papers and proceedings  |2 fast 
710 2 |a IEEE Computer Society  |b Test Technology Technical Committee. 
710 2 |a Institute of Electrical and Electronics Engineers  |b Philadelphia Section. 
780 0 0 |a IEEE VLSI Test Symposium  |t Digest of papers 
999 1 0 |i afad3c61-8089-4fb7-915f-1fc33d3873d4  |l 2697138  |s US-NIC  |m proceedings_ieee_vlsi_test_symposium_______________________________________1994_______ieeeca________________________________________ieee_vlsi_test_sympo_______________p 
999 1 1 |l 2697138  |s ISIL:US-NIC  |t CNR  |a engr,anx  |b 31924090444278  |c TK7874 .I243  |d lc  |k 1  |u 2002  |v 20th  |x Serial  |y 82cb2b24-c272-49aa-a7f8-f10d8156d9d5  |p LOANABLE