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|a (OCoLC)32735362
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|a TK7874
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|a IEEE VLSI Test Symposium
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|a Proceedings ... IEEE VLSI Test Symposium /
|c sponsored by the IEEE Computer Society, Technical Committee on Test Technology [and] IEEE Philadelphia Section
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|a IEEE VLSI Test Symposium
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|a VLSI Test Symposium
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|a Los Alamitos, Calif. :
|b IEEE Computer Society Press,
|c c1994-
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300 |
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|a v. :
|b ill. ;
|c 28 cm
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310 |
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|a Annual
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362 |
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|a 12th (1994)-
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650 |
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|a Integrated circuits
|x Very large scale integration
|x Testing
|x Congresses
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|a Integrated circuits
|x Very large scale integration
|x Testing
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|a Conference papers and proceedings
|2 fast
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|a IEEE Computer Society
|b Test Technology Technical Committee.
|
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|a Institute of Electrical and Electronics Engineers
|b Philadelphia Section.
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|a IEEE VLSI Test Symposium
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