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|a (OCoLC)IEEE608065487
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|a International Test Conference
|n (40th :
|d 2009 :
|c Austin, Tex.)
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|a International Test Conference 2009 :
|b proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA /
|c sponsored by IEEE Computer Society Test Technology Technical Council and IEEE Philadelphia Section
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|i Available from some providers with title:
|a Test Conference, 2009. ITC 2009. International
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|a ITC 2009
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|a Washington, D.C. :
|b International Test Conference,
|c [2009]
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|c ©2009
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|a 1 online resource :
|b illustrations
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|a text
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|a text file
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|a IEEE catalog number: CFP09ITC-CDR
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|a Title from PDF cover (IEEE Xplore, viewed on Apr. 20, 2010)
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|a Includes bibliographical references and index
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| 506 |
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|a Restricted for use by site license
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|a Electronic digital computers
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| 650 |
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7 |
|a Integrated circuits
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| 650 |
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|a Integrated circuits
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| 650 |
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7 |
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|a IEEE Computer Society
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|a Institute of Electrical and Electronics Engineers
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