International Test Conference 2009 : proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA /

International Test Conference 2009 : proceedings : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas, USA /

Bibliographic Details
Corporate Authors: International Test Conference Austin, Tex., IEEE Computer Society Test Technology Technical Committee, IEEE Xplore (Online service), Institute of Electrical and Electronics Engineers Philadelphia Section
Format: Conference Proceeding Book
Language:English
Published: Washington, D.C. : International Test Conference, [2009]
Subjects:
Electronic digital computers > Circuits > Testing > Congresses
Integrated circuits > Testing > Congresses
Semiconductors > Testing > Congresses
Electronic digital computers > Circuits > Testing
Integrated circuits > Testing
Semiconductors > Testing
Conference papers and proceedings
Description
Item Description:IEEE catalog number: CFP09ITC-CDR
Title from PDF cover (IEEE Xplore, viewed on Apr. 20, 2010)
Physical Description:1 online resource : illustrations
Bibliography:Includes bibliographical references and index
Access:Restricted for use by site license

Similar Items