|
|
|
|
| LEADER |
01469nam a2200325Ia 4500 |
| 001 |
7e8169cd-2755-47c2-85fb-4df8f01626d0 |
| 005 |
20230617000000.0 |
| 008 |
061211s2007 maua ob 001 0 eng d |
| 020 |
|
|
|z 158053709X
|
| 020 |
|
|
|z 9781580537094
|
| 020 |
|
|
|z 9781580537100
|
| 035 |
|
|
|a (CaPaEBR)ebr10221935
|
| 035 |
|
|
|a 8521771
|
| 040 |
|
|
|a CaPaEBR
|c CaPaEBR
|
| 050 |
1 |
4 |
|a TK7895.E42
|b K49 2007eb
|
| 100 |
1 |
|
|a Kelly, Joe,
|c Ph. D
|
| 245 |
1 |
0 |
|a Advanced production testing of RF, SoC, and SiP devices
|h [electronic resource] /
|c Joe Kelly, Michael Engelhardt
|
| 260 |
|
|
|a Boston :
|b Artech House,
|c 2007
|
| 300 |
|
|
|a xx, 301 p. :
|b ill
|
| 440 |
|
0 |
|a Artech House microwave library
|
| 504 |
|
|
|a Includes bibliographical references and index
|
| 506 |
|
|
|a Access restricted by licensing agreement
|
| 533 |
|
|
|a Electronic reproduction
|b Palo Alto, Calif. :
|c ebrary,
|d 2008.
|n Available via World Wide Web.
|n Access may be limited to ebrary affiliated libraries.
|
| 590 |
|
|
|a Access is available to the Yale community
|
| 650 |
|
0 |
|a Embedded computer systems
|
| 650 |
|
0 |
|a Systems on a chip
|x Testing
|
| 700 |
1 |
|
|a Engelhardt, M
|q (Michael)
|
| 710 |
2 |
|
|a ebrary, Inc
|
| 999 |
1 |
0 |
|i 7e8169cd-2755-47c2-85fb-4df8f01626d0
|l 8521771
|s US-CTY
|m advanced_production_testing_of_rf_soc_and_sip_devices_________________elect2007_______arteca________________________________________kelly__joe_________________________e
|
| 999 |
1 |
1 |
|l 8521771
|s ISIL:US-CTY
|t BKS
|a yulint
|c None
|p UNLOANABLE
|