Development of a semi-automatic Beta-backscatter thickness-measuring system : final report /
| Main Author: | |
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| Corporate Authors: | , |
| Format: | Government Document Book |
| Language: | English |
| Published: |
[Washington] : [Springfield, Va. :
Dept. of Energy ; for sale by the National Technical Information Service],
1979
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| Edition: | Rev |
| Series: | BDX ;
613-2102 (Rev.) |
| Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Stanford University
| Call Number: |
E 1.28:BDX-613-2102/REV. ISIL:US-CST MARCIVE |
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