The use of acoustic emission to determine the integrity of large kovar glass-sealed microelectronic packages /
Main Author: | |
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Corporate Authors: | , |
Format: | Government Document Book |
Language: | English |
Published: |
Washington, D.C. : [Springfield, VA :
U.S. Dept. of Commerce, National Bureau of Standards ; National Technical Information Service, distributor],
1982
Washington, D.C. : [Springfield, VA] : U.S. Dept. of Commerce, National Bureau of Standards ; [National Technical Information Service, distributor], 1982 |
Series: | NBS special publication ;
400-70 Semiconductor measurement technology |
Subjects: |
Internet
This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.Stanford University
Call Number: |
C 13.10:400-70 ISIL:US-CST |
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Duke University
Call Number: |
C 13.10:400-70 |
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